HIGH-RESOLUTION FREQUENCY-DOMAIN REFLECTOMETRY BY ESTIMATION OF MODULATED SUPERIMPOSED COMPLEX SINUSOIDS

被引:5
|
作者
VANHAMME, H [1 ]
机构
[1] VRIJE UNIV BRUSSELS,DEPT ELEC,B-1050 BRUSSELS,BELGIUM
关键词
D O I
10.1109/19.199407
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
By assuming a parametric model for a linear one-port or two-port, the time-domain resolution of a vector network analyzer can be significantly improved with respect to the Rayleigh limit. The measurement problem is formulated as a nonlinear least squares parameter estimation problem involving the extremization of a cost function. An extremization algorithm with good global convergence properties is presented for the case of discontinuities of small reflectivity modeled as simple lumped Frequency-Dependent elements. The reflection coefficient at either port of the DUT is modeled as a superposition of Modulated complex sinusoids. Through optimization of a sequence of cost functions, the algorithm produces a sequence of fits for models that incorporate an increasing number of discontinuities.
引用
收藏
页码:762 / 767
页数:6
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