AN ANTISCATTER DEVICE FOR LOW-TEMPERATURE CRYSTALLOGRAPHIC EXPERIMENTS WITH IMAGING PLATES

被引：23

作者：

DAROVSKY, A ^{[1
]}

BOLOTOVSKY, R ^{[1
]}

COPPENS, P ^{[1
]}

机构：

[1] SUNY BUFFALO,DEPT CHEM,BUFFALO,NY 14260

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1994年 / 27卷

关键词：

D O I：

10.1107/S0021889894006369

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The use of area detectors in low-temperature crystallographic data collection requires new methods for elimination of scattering by cryostat chambers, as diffracted-beam collimators can no longer be employed. The antiscatter device described is mounted inside the vacuum chamber and kept stationary during sample rotation by the use of a magnetic clamp. The device has been tested on both conventional and synchrotron sources.

引用

页码：1039 / 1040

页数：2