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RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD SILICON .4. THE SICL4-H2-N2 AND THE SIHCL3-H2-N2 SYSTEM
被引:25
作者
:
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
VALKENBURG, WGJN
论文数:
0
引用数:
0
h-index:
0
VALKENBURG, WGJN
机构
:
来源
:
JOURNAL OF CRYSTAL GROWTH
|
1982年
/ 57卷
/ 01期
关键词
:
D O I
:
10.1016/0022-0248(82)90264-0
中图分类号
:
O7 [晶体学];
学科分类号
:
0702 ;
070205 ;
0703 ;
080501 ;
摘要
:
引用
收藏
页码:177 / 184
页数:8
相关论文
共 21 条
[1]
CHEMISTRY AND TRANSPORT PHENOMENA OF CHEMICAL VAPOR-DEPOSITION OF SILICON FROM SICL4
BAN, VS
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
BAN, VS
GILBERT, SL
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
GILBERT, SL
[J].
JOURNAL OF CRYSTAL GROWTH,
1975,
31
(DEC)
: 284
-
289
[2]
CHEMICAL PROCESSES IN VAPOR-DEPOSITION OF SILICON .1. DEPOSITION FROM SICL2H2 AND ETCHING BY HCL
BAN, VS
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
BAN, VS
GILBERT, SL
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
GILBERT, SL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(10)
: 1382
-
1388
[3]
CHEMICAL PROCESSES IN VAPOR-DEPOSITION OF SILICON .2. DEPOSITION FROM SICL3H AND SICL4
BAN, VS
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
BAN, VS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(10)
: 1389
-
1391
[4]
TRANSPORT PHENOMENA MEASUREMENTS IN EPITAXIAL REACTORS
BAN, VS
论文数:
0
引用数:
0
h-index:
0
BAN, VS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(02)
: 317
-
320
[5]
BERKMAN S, 1978, HETEROEPITAXIAL SEMI, pCH7
[6]
RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD OF SILICON .1. THE SIH4-HCL-H2 SYSTEM
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
[J].
JOURNAL OF CRYSTAL GROWTH,
1980,
49
(03)
: 435
-
444
[7]
BLOEM J, 1980, CURRENT TOPICS MATER, V1, pCH4
[8]
RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD OF SILICON .2. THE SIH2CL2-H2-N2-HCL SYSTEM
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
[J].
JOURNAL OF CRYSTAL GROWTH,
1980,
50
(04)
: 807
-
815
[9]
RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD OF SILICON .3. THE SIH4-H2-N2 SYSTEM
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
[J].
JOURNAL OF CRYSTAL GROWTH,
1981,
51
(03)
: 443
-
452
[10]
Duchemin J. P., 1977, Revue Technique Thomson-CSF, V9, P33
←
1
2
3
→
共 21 条
[1]
CHEMISTRY AND TRANSPORT PHENOMENA OF CHEMICAL VAPOR-DEPOSITION OF SILICON FROM SICL4
BAN, VS
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
BAN, VS
GILBERT, SL
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
GILBERT, SL
[J].
JOURNAL OF CRYSTAL GROWTH,
1975,
31
(DEC)
: 284
-
289
[2]
CHEMICAL PROCESSES IN VAPOR-DEPOSITION OF SILICON .1. DEPOSITION FROM SICL2H2 AND ETCHING BY HCL
BAN, VS
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
BAN, VS
GILBERT, SL
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
GILBERT, SL
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(10)
: 1382
-
1388
[3]
CHEMICAL PROCESSES IN VAPOR-DEPOSITION OF SILICON .2. DEPOSITION FROM SICL3H AND SICL4
BAN, VS
论文数:
0
引用数:
0
h-index:
0
机构:
RCA LABS,PRINCETON,NJ 08540
RCA LABS,PRINCETON,NJ 08540
BAN, VS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(10)
: 1389
-
1391
[4]
TRANSPORT PHENOMENA MEASUREMENTS IN EPITAXIAL REACTORS
BAN, VS
论文数:
0
引用数:
0
h-index:
0
BAN, VS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(02)
: 317
-
320
[5]
BERKMAN S, 1978, HETEROEPITAXIAL SEMI, pCH7
[6]
RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD OF SILICON .1. THE SIH4-HCL-H2 SYSTEM
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
[J].
JOURNAL OF CRYSTAL GROWTH,
1980,
49
(03)
: 435
-
444
[7]
BLOEM J, 1980, CURRENT TOPICS MATER, V1, pCH4
[8]
RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD OF SILICON .2. THE SIH2CL2-H2-N2-HCL SYSTEM
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
[J].
JOURNAL OF CRYSTAL GROWTH,
1980,
50
(04)
: 807
-
815
[9]
RATE-DETERMINING REACTIONS AND SURFACE SPECIES IN CVD OF SILICON .3. THE SIH4-H2-N2 SYSTEM
CLAASSEN, WAP
论文数:
0
引用数:
0
h-index:
0
CLAASSEN, WAP
BLOEM, J
论文数:
0
引用数:
0
h-index:
0
BLOEM, J
[J].
JOURNAL OF CRYSTAL GROWTH,
1981,
51
(03)
: 443
-
452
[10]
Duchemin J. P., 1977, Revue Technique Thomson-CSF, V9, P33
←
1
2
3
→