DETAILS OF ELECTRON CORRELATION EXPLORED WITH VUV AND SOFT X-RADIATION

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CALDWELL, CD
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TH7 [仪器、仪表];
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0804 ; 080401 ; 081102 ;
摘要
One of the most successful applications of synchrotron radiation in the VUV and soft X-ray regions of the spectrum has been in the elucidation of details of electron correlations as they influence dynamics of photoionisation. With the improved resolution capabilities of new light sources, it becomes possible to examine these dynamics in even finer detail, exposing structure previously masked by experimental broadening. In addition, higher flux will make possible experiments on very dilute or transient species as well as types of experiments not feasible with older generation sources. Examples illustrating these possibilities will be drawn from recent results obtained using undulator radiation in the analysis of resonant Auger decay and double ionisation resulting from decay of excitations out of the 4d shell in xenon. In addition, prospects of future electron-electron coincidence experiments will be discussed.
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页码:188 / 191
页数:4
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