CELL FOR MEASURING SMALL LOSS TANGENTS OF DIELECTRICS AT LOW-TEMPERATURES

被引：0

作者：

POSADSKII, AA

KOLODIEV, BN

机构：

来源：

INDUSTRIAL LABORATORY | 1979年 / 45卷 / 01期

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D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：51 / 53

页数：3

共 50 条

[31] EFFECTS OF LOW-TEMPERATURES ON CELL-DIVISION
LAMBERT, AM
JOURNAL DE MICROSCOPIE ET DE BIOLOGIE CELLULAIRE, 1976, 26 (2-3): : A17 - A17
[32] INDUSTRIAL DETECTORS FOR MEASURING THERMAL-RADIATION AT LOW-TEMPERATURES
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[33] ULTRASOUND ABSORPTION IN FERRODIELECTRICS WITH SMALL ANISOTROPY AT LOW-TEMPERATURES
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[34] SMALL SENSITIVE PRESSURE TRANSDUCER FOR USE AT LOW-TEMPERATURES
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[35] LOW-POWER DEVICE FOR MEASURING ELECTRIC-FIELDS AT LOW-TEMPERATURES
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[36] A TECHNIQUE FOR MEASURING MICROWAVE LOSSES OF LOW LOSS CERAMIC DIELECTRICS
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[37] MEASURING CAPACITANCE AND LOSS ANGLE OF LOW-Q DIELECTRICS
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[38] REDUCED CONDUCTIVITY OF DIELECTRICS WHEN BOTH BOUNDARY AND DISLOCATION SCATTERINGS ARE IMPORTANT AT LOW-TEMPERATURES
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[39] CHARGE INSTABILITY MECHANISM FOR MDS STRUCTURES BASED ON INSB WITH DIELECTRICS PREPARED AT LOW-TEMPERATURES
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[40] FLUCTUATIONS AT LOW-TEMPERATURES
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