DOUBLE RESOLUTION WITH A SISAM SPECTROMETER

被引:6
作者
DUPRE, J
PINSON, P
MEYER, C
BARCHEWITZ, P
机构
关键词
D O I
10.1364/AO.10.001177
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:1177 / +
页数:1
相关论文
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APPLIED OPTICS, 1970, 9 (07) :1587-+
[3]  
GRANER G, 1965, THESIS PARIS
[4]   MEASUREMENT OF INTERFEROMETRIC SECONDARY WAVELENGTH STANDARDS IN THE NEAR INFRARED [J].
RANK, DH ;
BENNETT, JM ;
BENNETT, HE .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (07) :477-484