MODAL-ANALYSIS OF THE GAP EFFECT IN WAVE-GUIDE DIELECTRIC MEASUREMENTS

被引：29

作者：

WILSON, SB ^{[1
]}

机构：

[1] ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1988年 / 36卷 / 04期

关键词：

Manuscript received January 26. 1987; revised July 25; 1987. This work was supported in part by Rockwell International Science Center IR&D. The author was with the Rockwell International Science Center; Thousand oaks; CA. He is now with National Patent Analytical Systems; Shrewsbury; NJ 07701. IEEE Log Number 8719437;

D O I：

10.1109/22.3581

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：752 / 756

页数：5

共 7 条

[1] INFLUENCE OF WAVEGUIDE CONTACT ON MEASURED COMPLEX PERMITTIVITY OF SEMICONDUCTORS [J].