PROPERTIES OF MULTILAYER FILMS OF Y1Ba2Cu3O7-x AND COMPOSITES OF Y1Ba2Cu3O7-x/LaAlO3

被引:1
作者
Allen, L. H. [1 ]
Sherrill, G. K. [1 ]
Holm, R. T. [1 ]
Cukauskas, E. J. [1 ]
机构
[1] Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA
关键词
D O I
10.1109/77.233903
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have grown multilayer films of Y1Ba2Cu3O7-x with composites of Y1Ba2Cu3O7-x and LaAlO3 on (100) LaAlO3 substrates by co-sputtering. We have measured inductive and resistive T-C's for multilayers with various amounts of LaAlO3 in the composite layers and for multilayers with different composite layer thicknesses. T-C's generally drop as the amount of LaAlO3 in the composite layer increases or the thickness of the composite layer increases. J(C)'s of these films have values below those for single layer composite films grown on MgO substrates, but this can be accounted for by the introduction of grain boundaries into the films from substrate twinning. Initial photoresponse measurements were also made and have magnitudes comparable to the single layer YBCO/LAO composite films.
引用
收藏
页码:1616 / 1619
页数:4
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