IMAGING OF ALUMINUM BY FIELD-ION MICROSCOPY

被引：7

作者：

ZINGG, W ^{[1
]}

WARLIMONT, H ^{[1
]}

机构：

[1] SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 45卷 / 01期

关键词：

D O I：

10.1002/pssa.2210450113

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：117 / 122

页数：6

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