IMAGING OF ALUMINUM BY FIELD-ION MICROSCOPY

被引：7
作者：
ZINGG, W [1 ]
WARLIMONT, H [1 ]
机构：
[1] SWISS ALUMINIUM LTD,DEPT RES & DEV,CH-8212 NEUHAUSEN AM RHEI,SWITZERLAND
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 45卷 / 01期
关键词：
D O I：
10.1002/pssa.2210450113
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：117 / 122
页数：6
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