NEUTRON DAMAGE IN GE(HP) COAXIAL DETECTORS

被引：14

作者：

DARKEN, LS ^{[1
]}

TRAMMELL, RC ^{[1
]}

RAUDORF, TW ^{[1
]}

PEHL, RH ^{[1
]}

机构：

[1] EG&G ORTEC,100 MIDLAND RD,OAK RIDGE,TN 37830

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1981年 / 28卷 / 01期

关键词：

D O I：

10.1109/TNS.1981.4331241

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：572 / 578

页数：7

共 11 条

[1]

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[2]

CLELAND JW, 1964, RAD DAMAGE SEMICONDU, P401

[3]

CLELAND JW, 1960, P INT C SEM PHYS PRA, P299

[4] MECHANISM FOR FAST-NEUTRON DAMAGE OF GE(HP) DETECTORS [J].

DARKEN, LS ;

TRAMMELL, RC ;

RAUDORF, TW ;

PEHL, RH ;

ELLIOTT, JH .

NUCLEAR INSTRUMENTS & METHODS, 1980, 171 (01) :49-59

[5] DEFECT CLUSTERS AND SIMPLE DEFECT BUILDUP KINETICS IN FAST-NEUTRON IRRADIATED N-SI [J].

DOLGOLENKO, AP ;

FISHCHUK, II .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 50 (02) :751-755

[6]

GOULDING FS, 1969, SEMICONDUCTOR NUCLEA

[7]

KONOPLEV.RF, 1974, SOV PHYS SEMICOND+, V7, P906

[8] FAST-NEUTRON DAMAGE IN GERMANIUM DETECTORS [J].

KRANER, HW .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (01) :218-234

[9] FAST-NEUTRON RADIATION-DAMAGE OF HIGH-PURITY GERMANIUM DETECTORS [J].

KRANER, HW ;

PEHL, RH ;

HALLER, EE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, NS22 (01) :149-159

[10] CAPACITANCE TRANSIENT SPECTROSCOPY [J].

MILLER, GL ;

LANG, DV ;

KIMERLING, LC .

ANNUAL REVIEW OF MATERIALS SCIENCE, 1977, 7 :377-448

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