1-THZ-BANDWIDTH PROBER FOR HIGH-SPEED DEVICES AND INTEGRATED-CIRCUITS

被引：85

作者：

VALDMANIS, JA

机构：

[1] AT&T Bell Lab, Murray Hill, NJ,, USA, AT&T Bell Lab, Murray Hill, NJ, USA

来源：

ELECTRONICS LETTERS | 1987年 / 23卷 / 24期

关键词：

INTEGRATED CIRCUITS - OPTICAL VARIABLES MEASUREMENT;

D O I：

10.1049/el:19870905

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe an external electro-optic technique for characterizing high-speed electrical signals in two-dimensional electrode structures of devices and integrated circuits fabricated on any substrate material. A temporal resolution of less than 300 fs, corresponding to a bandwidth in excess of 1 THz, has been achieved.

引用

页码：1308 / 1310

页数：3

共 5 条

[1] EXCITATION OF COHERENT PHONON POLARITONS WITH FEMTOSECOND OPTICAL PULSES [J].