AN AUTOMATIC FLANK CONTROL FOR DOUBLE-CRYSTAL X-RAY TOPOGRAPHY

被引：5
|
作者：
BONSE, U
LOTSCH, H
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 11期
关键词：
D O I：
10.1088/0022-3735/14/11/006
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1248 / 1249
页数：2
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