AN AUTOMATIC FLANK CONTROL FOR DOUBLE-CRYSTAL X-RAY TOPOGRAPHY

被引：5

作者：

BONSE, U

LOTSCH, H

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 11期

关键词：

D O I：

10.1088/0022-3735/14/11/006

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1248 / 1249

页数：2

共 50 条

[1] Microcomputer System for Automatic Control of Double-Crystal X-Ray Spectrometer.
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[2] DOUBLE-CRYSTAL X-RAY MONOCHROMATOR
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[3] QUANTITATIVE DOUBLE-CRYSTAL X-RAY DISPERSION TOPOGRAPHY WITH A POINT FOCUS SOURCE
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[4] WAVE-PACKETS AND MICRODEFECT IMAGES IN DOUBLE-CRYSTAL X-RAY TOPOGRAPHY
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[5] Quantitative double-crystal x-ray dispersion topography with a point focus source
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[6] DOUBLE-CRYSTAL, VACUUM X-RAY DIFFRACTOMETER
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[7] DOUBLE-CRYSTAL X-RAY SPECTROSCOPY AT JET
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[9] AN AUTOMATIC SCANNING DEVICE FOR X-RAY DIFFRACTION MEASUREMENTS WITH A DOUBLE-CRYSTAL SPECTROMETER
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[10] AN AUTOMATIC SCANNING DEVICE FOR X-RAY DIFFRACTION MEASUREMENTS WITH A DOUBLE-CRYSTAL SPECTROMETER
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