共 4 条
- [1] AMEMIYA H, 1967, RCA REV, V28, P241
- [2] EMILE P, 1962, ELECTRON EQUIPMENT E, V10, P83
- [3] STEWART JL, CIRCUIT ANALYSIS TRA
- [4] WEEKS WT, 1968, TR001740 IBM TECH RE
CHARACTERIZATION OF MULTIPLE PARALLEL TRANSMISSION LINES USING TIME DOMAIN REFLECTOMETRY
被引：9
作者：
CAREY, VL
SCOTT, TR
WEEKS, WT
机构：
[1] Components Division, IBM Corporation, Poughkeepsie, N. Y.
关键词：
D O I：
10.1109/TIM.1969.4313795
中图分类号：
TM [电工技术];
TN [电子技术、通信技术];
学科分类号：
0808 ;
0809 ;
摘要：
Two methods of using time domain reflectometry for the characterization of a system of multiple parallel transmission lines are described. The two methods are the reflection method and the direct method. The selection of a method depends on the accuracy required and the property of the system of transmission lines to be measured:[Yo], [Zo], [C], or [L]. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
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页码：166 / &
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