EFFECT OF TRAPS AND LEAKAGE CURRENTS ON CHARACTERISTICS OF THIN-FILM FIELD TRIODES

被引：0

作者：

ZHDAN, AG

YELINSON, MI

CHUGUNOV.MY

机构：

来源：

RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR | 1968年 / 13卷 / 06期

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中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：913 / &

共 15 条

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GUTIERREZ, WA ;

WILSON, HL .

[4]

LURYE MS, 1966, PROBLEMS THINFILM EL, P264

[5]

MILLER RS, 1964, J APPL PHYS, V35, P1550

[6]

NICHOLAS KH, 1964, J APPL PHYS, V15, P783

[7] A UNIPOLAR FIELD-EFFECT TRANSISTOR [J].

SHOCKLEY, W .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (11) :1365-1376

[8]

Weimer P. K., 1964, PHYS THIN FILMS, P147

[9]

WEIMER PK, 1963, RCA REV, V24, P661

[10]

YELINSON MI, 1965, DOKLADY AN SSSR, V162, P789