THICKNESS DEPENDENCE OF RESISTIVITY IN IN-BI THIN-FILMS

被引：1
作者：
DAS, VD
JAGADEESH, MS
机构：
来源：
VACUUM | 1981年 / 31卷 / 01期
关键词：
D O I：
10.1016/S0042-207X(81)80091-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：15 / 17
页数：3
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