AN APPROXIMATE ANALYSIS OF STRESSES IN MULTILAYERED ELASTIC THIN-FILMS

[1] FREUND LB, 1981, UNPUB SHEAR STRESS F

[2] NEW APPROACH TO THE HIGH-QUALITY EPITAXIAL-GROWTH OF LATTICE-MISMATCHED MATERIALS [J]. APPLIED PHYSICS LETTERS, 1986, 49 (03) : 140 - 142

[3] CALCULATED STRESSES IN MULTILAYERED HETEROEPITAXIAL STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (06) : 2543 - 2547

[4] INTERFACE STRESS OF ALXGA1-XAS-GAAS LAYER STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (07) : 3171 - 3175

[5] ROLL K, 1976, J APPL PHYS, V47, P3224, DOI 10.1063/1.323119

[6] The tension of metallic films deposited by electrolysis [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1909, 82 (553) : 172 - 175

[7] SUHIR E, 1986, 1986 INT S MICR P AT, P383

[8] SUHIR E, 1986, UNPUB 1986 ASME WAM

[9] SUHIR E, 1986, ASME, V53, P657

[10] SUHIR E, 1986, MATER RES SOC S P, V72, P133

[1] FREUND LB, 1981, UNPUB SHEAR STRESS F

[2] NEW APPROACH TO THE HIGH-QUALITY EPITAXIAL-GROWTH OF LATTICE-MISMATCHED MATERIALS [J]. APPLIED PHYSICS LETTERS, 1986, 49 (03) : 140 - 142

[3] CALCULATED STRESSES IN MULTILAYERED HETEROEPITAXIAL STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (06) : 2543 - 2547

[4] INTERFACE STRESS OF ALXGA1-XAS-GAAS LAYER STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (07) : 3171 - 3175

[5] ROLL K, 1976, J APPL PHYS, V47, P3224, DOI 10.1063/1.323119

[6] The tension of metallic films deposited by electrolysis [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1909, 82 (553) : 172 - 175

[7] SUHIR E, 1986, 1986 INT S MICR P AT, P383

[8] SUHIR E, 1986, UNPUB 1986 ASME WAM

[9] SUHIR E, 1986, ASME, V53, P657

[10] SUHIR E, 1986, MATER RES SOC S P, V72, P133