MULTIELECTRON X-RAY PHOTOEXCITATION MEASUREMENTS IN KRYPTON

被引：39

作者：

DEUTSCH, M ^{[1
]}

HART, M ^{[1
]}

机构：

[1] UNIV MANCHESTER,SCHUSTER LAB,MANCHESTER M13 9PL,LANCS,ENGLAND

来源：

PHYSICAL REVIEW LETTERS | 1986年 / 57卷 / 13期

关键词：

D O I：

10.1103/PhysRevLett.57.1566

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1566 / 1569

页数：4

共 23 条

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