WEAK-BEAM ELECTRON-MICROSCOPY ANALYSIS OF DEFECT CLUSTERS IN HEAVY-ION IRRADIATED SILVER AND COPPER

被引:40
作者
JENKINS, ML [1 ]
机构
[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD,ENGLAND
来源
PHILOSOPHICAL MAGAZINE | 1974年 / 29卷 / 04期
关键词
D O I
10.1080/14786437408222073
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:813 / 828
页数:16
相关论文
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