SEM INSITU OBSERVATION OF GRAIN-BOUNDARY MIGRATION DURING RECRYSTALLIZATION OF COLD-WORKED COPPER SINGLE-CRYSTALS

被引：0
作者：
SCHMIDT, PF [1 ]
GREWE, HG [1 ]
机构：
[1] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER
来源：
SCANNING ELECTRON MICROSCOPY | 1981年
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：367 / 372
页数：6
相关论文
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