CRITICAL CURRENT-DENSITY MEASUREMENTS OF YBA2CU3O7-X THIN-FILMS BY NONRESONANT R F ABSORPTION METHOD

被引：9
作者：
SRINIVASU, VV
THOMAS, B
VASANTHACHARYA, NY
HEGDE, MS
BHAT, SV
机构：
[1] Department of Physics, Solid State and Structural Chemistry Unit, Indian Institute of Science, Bangalore
来源：
SOLID STATE COMMUNICATIONS | 1991年 / 79卷 / 09期
关键词：
D O I：
10.1016/0038-1098(91)90783-R
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
A new, contact-less technique for the measurement of the critical current density J(c) using the non-resonant r.f. absorption phenomenon is proposed. J(c) in thin film samples of YBa2Cu3O7-x prepared by pulsed laser deposition are measured by this technique as well as the transport current method. Satisfactory agreement is obtained between the results of the two techniques.
引用
收藏
页码：713 / 716
页数：4
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