Z-CONTRAST STEM FOR MATERIALS SCIENCE

被引:484
作者
PENNYCOOK, SJ
机构
关键词
D O I
10.1016/0304-3991(89)90173-3
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:58 / 69
页数:12
相关论文
共 47 条
[1]  
Beaman DR., 1975, PHYSICAL ASPECTS ELE, P47
[2]  
BURSILL LA, 1984, OPTIK, V66, P251
[3]   SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1976, 2 (01) :3-16
[4]   A SCANNING MICROSCOPE WITH 5 A RESOLUTION [J].
CREWE, AV ;
WALL, J .
JOURNAL OF MOLECULAR BIOLOGY, 1970, 48 (03) :375-&
[5]   THE PHYSICS OF THE HIGH-RESOLUTION SCANNING MICROSCOPE [J].
CREWE, AV .
REPORTS ON PROGRESS IN PHYSICS, 1980, 43 (05) :621-&
[6]   HREM STUDY OF THE DEFECTS IN THE ORTHORHOMBIC SUPERCONDUCTOR YBA2CU3O7 +/-EPSILON .2. OXYGEN SUBSTOICHIOMETRY AND CATIONIC DISORDER [J].
DOMENGES, B ;
HERVIEU, M ;
MICHEL, C ;
RAVEAU, B .
EUROPHYSICS LETTERS, 1987, 4 (02) :211-214
[7]  
DONALD A, 1980, PHILOS MAG A, V39, P1
[8]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[9]   MOLECULAR-WEIGHT DETERMINATION BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].
ENGEL, A .
ULTRAMICROSCOPY, 1978, 3 (03) :273-281
[10]  
FERTIG J, 1981, OPTIK, V59, P407