SPATIAL CORRELATION-MEASUREMENTS OF 1/F NOISE IN SEMICONDUCTORS

被引：5

作者：

CELIKBUTLER, Z ^{[1
]}

HSIANG, TY ^{[1
]}

机构：

[1] UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14627

来源：

SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 02期

关键词：

D O I：

10.1016/0038-1101(88)90135-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：241 / 244

页数：4

共 11 条

[1]

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HSIANG, TY .

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[4]

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[7] 1-F NOISE FROM THERMAL FLUCTUATIONS IN METAL-FILMS [J].

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[8] LOW-FREQUENCY NOISE IN TIN AND LEAD FILMS AT SUPERCONDUCTING TRANSITION [J].

CLARKE, J ;

HSIANG, TY .

PHYSICAL REVIEW B, 1976, 13 (11) :4790-4800

[9]

Kittel C, 1976, INTRO SOLID STATE PH, V8

[10] THEORY AND EXPERIMENT ON THE 1/F-GAMMA NOISE IN P-CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS AT LOW DRAIN BIAS [J].

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HSIANG, TY .

PHYSICAL REVIEW B, 1986, 33 (07) :4898-4905

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