X-RAY-FLUORESCENCE ANALYSIS UTILIZING THE FUNDAMENTAL PARAMETER METHOD FOR THE DETERMINATION OF THE ELEMENTAL COMPOSITION IN PLANT-SAMPLES

被引：56

作者：

OMOTE, J ^{[1
]}

KOHNO, H ^{[1
]}

TODA, K ^{[1
]}

机构：

[1] RIGAKU IND CO,CTR APPL TECHNOL,TAKATSUKI,OSAKA 569,JAPAN

来源：

ANALYTICA CHIMICA ACTA | 1995年 / 307卷 / 01期

关键词：

X-RAY FLUORESCENCE SPECTROMETRY; PLANT SAMPLES; FUNDAMENTAL PARAMETER METHOD;

D O I：

10.1016/0003-2670(95)00033-V

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

X-ray fluorescence (XRF) has been widely used for the elemental analysis in the field of quality control of processes and research since it has the capability of performing non-destructive analysis and requires easy-to-prepare samples. In general, quantitative analysis is carried out by the calibration curve method, obtained with many standard samples. However, for some applications, such as a plant sample, it may be difficult to prepare standard materials. The recent development of the fundamental parameter (FP) method makes it possible to perform a quantitative analysis using a few standards or reference samples. In the analysis program semiquantitative results can be calculated using the X-ray intensities of the detected elements. The recent application of XRF to plant analysis using the FP method is discussed in this paper.

引用

页码：117 / 126

页数：10

共 7 条

[1] CALCULATION METHODS FOR FLUORESCENT X-RAY SPECTROMETRY - EMPIRICAL COEFFICIENTS VS FUNDAMENTAL PARAMETERS
CRISS, JW
BIRKS, LS
[J]. ANALYTICAL CHEMISTRY, 1968, 40 (07) : 1080 - &
[2] THE USE OF MIRES IN MONITORING THE ATMOSPHERIC DEPOSITION OF HEAVY-METALS
GLOOSCHENKO, WA
HOLLOWAY, L
ARAFAT, N
[J]. AQUATIC BOTANY, 1986, 25 (02) : 179 - 190
[3] KOHNO H, 1988, PROG XRAY ANAL, V19, P307
[4] KOHNO H, 1992, PROG XRAY ANAL, V23, P189
[5] LAGUITTON D, 1977, ADV XRAY ANAL, V20, P515
[6] THE THEORETICAL DERIVATION OF FLUORESCENT X-RAY INTENSITIES FROM MIXTURES
SHERMAN, J
[J]. SPECTROCHIMICA ACTA, 1955, 7 (05): : 283 - 306
[7] THEORETICAL CALCULATION OF FLUORESCENT X-RAY INTENSITIES IN FLUORESCENT X-RAY SPECTROCHEMICAL ANALYSIS
SHIRAIWA, T
FUJINO, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (10) : 886 - &

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