STUDY OF DRIVER CIRCUITS WITH REDUNDANCY OF A DRIVER INTEGRATED POLY-SI TFT-LCD

被引：0

作者：

AKEBI, Y

YAMASHITA, T

SHIMADA, T

TOUICHI, T

TAKAFUJI, Y

机构：

来源：

SHARP TECHNICAL JOURNAL | 1993年 / 56期

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Defect-tolerant structures of peripheral drivers for a very small driver integrated AMLCD (Active Matrix Liquid Crystal Disply) using polysilicon TFT(Thin Film Transistor) are studied. The driver has several blocks of parallel shift registers, connected by logic gates. Yield prediction for the present redundancy model shows that the optimum number of the parallel blocks and the stages of shift registers in the blocks are two, and less than about 30 stages, respectively. This redundant structure is applied to a small driver full-integrated AMLCD, and supeviority of the present defect tolerant technology is confirmed.

引用

页码：39 / 42

页数：4