CHEMICAL-BOND AND RELATED PROPERTIES OF SIO2 .7. STRUCTURE AND ELECTRONIC PROPERTIES OF THE SIOX REGION OF SI-SIO2 INTERFACES

被引：76
作者：
HUBNER, K
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 61卷 / 02期
关键词：
D O I：
10.1002/pssa.2210610241
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：665 / 673
页数：9
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