共 10 条
[1]
Ejiri, Uno, Mese, Ikeda, A process for detecting defects in complicated patterns, Computer Graphics and Image Processing, 2, pp. 326-339, (1973)
[2]
Uno, Mese, Ejiri, Defect detection in complicated patterns, Electrical Engineering in Japan, 95, pp. 90-97, (1975)
[3]
Rosenfeld, Connectivity in digital pictures, Journal of the ACM, 18, pp. 255-264, (1971)
[4]
Danielsson, Pipe-lining of neighborhood operations, Digital Processes, 3, pp. 3-15, (1977)
[5]
Gray, Local properties of binary images in two dimensions, IEEE Transactions on Computers, 100-120, pp. 551-561, (1971)
[6]
Kruse, Design and Implementation of a Picture Processor, Dissertations No. 13, (1977)
[7]
Wojcik, Automatic detection of semiconductor mask defects, Microelectronics Reliability, 15, pp. 585-593, (1976)
[8]
Wojcik, A system for an automatic detection of defects of semiconductor masks and printed circuit boards, Electron. Technology, 10, 4, pp. 95-108, (1977)
[9]
Danielsson, Kruse, Distance Checking Algorithms, Internal Report I-0175, (1977)
[10]
Restrick, An automatic optical printed circuit inspection system, Proc. SPIE Solid State Imaging Devices, 116, pp. 76-81, (1977)