DIRECT VISUAL OBSERVATION OF POWDER DYNAMICS IN RF PLASMA-ASSISTED DEPOSITION

被引:74
作者
HOWLING, AA
HOLLENSTEIN, C
PARIS, PJ
机构
[1] Centre de Recherches en Physique des Plasmas, Ecole Polytechnique Fédérale de Lausanne, 1007 Lausanne
关键词
D O I
10.1063/1.105322
中图分类号
O59 [应用物理学];
学科分类号
摘要
Contamination due to particles generated and suspended in silane rf plasmas is investigated. Powder is rendered visible by illumination of the reactor volume. This simple diagnostic for global, spatio-temporal powder dynamics is used to study particle formation, trapping, and powder reduction by power modulation.
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收藏
页码:1409 / 1411
页数:3
相关论文
共 11 条
[1]   PARTICULATE GENERATION IN SILANE AMMONIA RF DISCHARGES [J].
ANDERSON, HM ;
JAIRATH, R ;
MOCK, JL .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (09) :3999-4011
[2]   EFFECT OF SUBSTRATE-TEMPERATURE ON DEPOSITION RATE OF RF PLASMA-DEPOSITED HYDROGENATED AMORPHOUS-SILICON THIN-FILMS [J].
ANDUJAR, JL ;
BERTRAN, E ;
CANILLAS, A ;
CAMPMANY, J ;
MORENZA, JL .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (06) :3757-3759
[3]  
BOUCHOULE A, UNPUB
[4]  
Gallagher A., 1988, International Journal of Solar Energy, V5, P311, DOI 10.1080/01425918708914428
[5]  
GARSCADDEN A, 1990, NONEQUILIBRIUM PROCE, P541
[6]   ELECTRON-TRANSPORT COEFFICIENTS IN DUSTY ARGON PLASMAS [J].
MCCAUGHEY, MJ ;
KUSHNER, MJ .
APPLIED PHYSICS LETTERS, 1989, 55 (10) :951-953
[7]   INSITU LASER DIAGNOSTIC STUDIES OF PLASMA-GENERATED PARTICULATE CONTAMINATION [J].
SELWYN, GS ;
SINGH, J ;
BENNETT, RS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2758-2765
[8]   PARTICLE TRAPPING PHENOMENA IN RADIO-FREQUENCY PLASMAS [J].
SELWYN, GS ;
HEIDENREICH, JE ;
HALLER, KL .
APPLIED PHYSICS LETTERS, 1990, 57 (18) :1876-1878
[9]   PARTICLE DISTRIBUTIONS AND LASER PARTICLE INTERACTIONS IN AN RF DISCHARGE OF SILANE [J].
SPEARS, KG ;
ROBINSON, TJ ;
ROTH, RM .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1986, 14 (02) :179-187
[10]   PARTICLE NUMBER DENSITIES BY LIGHT-SCATTERING FLUCTUATION ANALYSIS [J].
SPEARS, KG ;
ROBINSON, TJ .
JOURNAL OF PHYSICAL CHEMISTRY, 1988, 92 (18) :5302-5305