SUB-MICRON MOLECULAR IMAGING - A VIABILITY STUDY BY TIME-OF-FLIGHT SIMS

被引：34

作者：

BRIGGS, D

HEARN, MJ

机构：

来源：

关键词：

D O I：

10.1002/sia.740130403

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：181 / &

共 8 条

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[2] INTERACTION OF ION-BEAMS WITH POLYMERS, WITH PARTICULAR REFERENCE TO SIMS
BRIGGS, D
HEARN, MJ
[J]. VACUUM, 1986, 36 (11-12) : 1005 - 1010
[3] ANALYSIS OF POLYMER SURFACES BY SIMS .3. PRELIMINARY-RESULTS FROM MOLECULAR IMAGING AND MICROANALYSIS EXPERIMENTS
BRIGGS, D
[J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (03) : 113 - 118
[4] ECCLES AJ, IN PRESS J VAC SCI T
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[6] STEFFENS P, 1984, SECONDARY ION MASS S, V4, P404
[7] WAUGH AR, 1986, MICROBEAM ANAL 1986, P82
[8] WAUGH AR, 1988, SECONDARY ION MASS S, V6, P231