HIGH ACCEPTOR PRODUCTION-RATE IN ELECTRON-IRRADIATED N-TYPE GAAS - IMPACT ON DEFECT MODELS

被引:12
作者
LOOK, DC
机构
关键词
D O I
10.1063/1.98831
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:843 / 845
页数:3
相关论文
共 50 条
[31]   Deep levels in high-temperature 1 MeV electron-irradiated n-type Czochralski silicon [J].
Simoen, E ;
Rafí, JM ;
Claeys, C ;
Neimash, V ;
Kraitchinskii, A ;
Kras'ko, M ;
Tischenko, V ;
Voitovych, V ;
Versluys, J ;
Clauws, P .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (12) :7184-7188
[32]   Electron Paramagnetic Resonance study on n-type electron-irradiated 3C-SiC [J].
Carlsson, P. ;
Rabia, K. ;
Son, N. T. ;
Ohshima, T. ;
Morishita, N. ;
Itoh, H. ;
Isoya, J. ;
Janzen, E. .
PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2008, 100
[33]   ANNEALING OF ELECTRON-IRRADIATED N-TYPE SILICON .1. DONOR CONCENTRATION DEPENDENCE [J].
KIMERLING, LC ;
DEANGELIS, HM ;
CARNES, CP .
PHYSICAL REVIEW B-SOLID STATE, 1971, 3 (02) :427-+
[34]   HYDROGEN EFFECTS ON THE ELECTRICAL-PROPERTIES OF ELECTRON-IRRADIATED N-TYPE SI EPILAYERS [J].
SHLOPAK, NV ;
ULYASHIN, AG ;
BUMAI, YA .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 86 (3-4) :298-302
[35]   POSITRON-ANNIHILATION IN ELECTRON-IRRADIATED N-TYPE AND P-TYPE SILICON-CRYSTALS [J].
AREFEV, KP ;
VOROBEV, SA ;
TSOI, AA .
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1982, 16 (07) :807-808
[36]   IMPURITY DEPENDENCE OF DEFECT INTRODUCTION AND ANNEALING IN ELECTRON IRRADIATED N-TYPE GERMANIUM [J].
CLELAND, JW ;
PACIESAS, WS .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1969, NS16 (06) :19-&
[37]   Defects in low-energy electron-irradiated n-type 4H-SiC [J].
Beyer, F. C. ;
Hemmingsson, C. ;
Pedersen, H. ;
Henry, A. ;
Isoya, J. ;
Morishita, N. ;
Ohshima, T. ;
Janzen, E. .
PHYSICA SCRIPTA, 2010, T141
[38]   ELECTRICAL STUDIES OF ELECTRON-IRRADIATED N-TYPE SI - IMPURITY AND IRRADIATION-TEMPERATURE DEPENDENCE [J].
STEIN, HJ ;
VOOK, FL .
PHYSICAL REVIEW, 1967, 163 (03) :790-&
[39]   INFLUENCE OF IRRADIATION TEMPERATURE AND OF NATURE OF DOPANT ON FORMATION OF DEFECTS IN N-TYPE ELECTRON-IRRADIATED SILICON [J].
VAVILOV, VS ;
GLAZMAN, VB ;
ISAEV, NU ;
MUKASHEV, BN ;
SPITSYN, AV .
SOVIET PHYSICS SEMICONDUCTORS-USSR, 1974, 8 (03) :303-305
[40]   ENERGY DEPENDENCE OF DAMAGE RECOVERY IN N-TYPE GE ELECTRON-IRRADIATED AT 4.2 DEGREES K [J].
PENCZER, RE ;
DEANGELIS, HM .
PHYSICAL REVIEW, 1968, 171 (03) :862-+