X-RAY DIFFRACTION METHOD FOR DETERMINATION OF SIZES AND STRUCTURAL CHARACTERISTICS OF NANOGRAPHITES IN ACTIVATED CARBON MATERIALS

被引：0

作者：

Saenko, N. S. ^{[1
]}

Ziatdinov, A. M. ^{[1
]}

机构：

[1] RAS, Inst Chem FEB, Lab Elect Phys Methods, Prospekt 100 Letiya,159, Vladivostok 690022, Russia

来源：

IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII KHIMIYA I KHIMICHESKAYA TEKHNOLOGIYA | 2016年 / 59卷 / 09期

关键词：

activated carbon fibers; nanographite; nanographene; X-ray diffraction; Raman spectroscopy small-angle X-ray scattering;

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The method for determination of sizes and structural characteristics of nanographites in activated carbon fibers (ACFs) by analyzing their experimental X-ray diffraction profiles has been developed in the paper. It uses the curves of X-ray scattering calculated for the set of nanographites consisting of benzene-and phenalene-bazed nanographenes of various sizes, which interatomic and interlayer distances depend on the number of atoms in layer. The developed method can be also applied to analysis of the X-ray diffraction profiles of other nanocrystalline graphite structures. The data acquired by the method agree with results of Raman spectroscopy and small-angle X-ray scattering on ACFs structure motives.

引用

页码：62 / 67

页数：6

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