E-BEAM DEPOSITION CHARACTERISTICS OF REACTIVELY EVAPORATED TA2O5 FOR OPTICAL INTERFERENCE COATINGS

被引:32
作者
HERRMANN, WC
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 18卷 / 03期
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D O I
10.1116/1.570921
中图分类号
O59 [应用物理学];
学科分类号
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页码:1303 / 1305
页数:3
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共 4 条
[1]  
ARNON O, 1978, THESIS U ROCHESTER R
[2]   USE OF HAFNIUM DIOXIDE IN MULTILAYER DIELECTRIC REFLECTORS FOR NEAR UV [J].
BAUMEISTER, P ;
ARNON, O .
APPLIED OPTICS, 1977, 16 (02) :439-444
[3]   OPTICAL PROPAGATION IN SHEET AND PATTERN GENERATED FILMS OF TA2O5 [J].
HENSLER, DH ;
CUTHBERT, JD ;
MARTIN, RJ ;
TIEN, PK .
APPLIED OPTICS, 1971, 10 (05) :1037-+
[4]   EFFECTS OF DEPOSITION PARAMETERS ON OPTICAL LOSS FOR RF-SPUTTERED TA2O5 AND SI3N4 WAVEGUIDES [J].
PAULSON, WM ;
HICKERNELL, FS ;
DAVIS, RL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :307-310