Scanning Photoelectron Microscopy: a Powerful Technique for Probing Micro and Nano-Structures

被引：56
作者：
Abyaneh, Majid Kazemian [1 ]
Gregoratti, Luca [1 ]
Amati, Matteo [1 ]
Dalmiglio, Matteo [1 ]
Kiskinova, Maya [1 ]
机构：
[1] Sincrotrone Trieste SCpA, Area Sci Pk, SS-14,Km 163-5, I-34149 Trieste, Bassoviza, Italy
来源：
E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY | 2011年 / 9卷
关键词：
Scanning photoelectron microscopy (SPEM); Multi-wall carbon nanotube; XPS; Spectromicroscopy;
D O I：
10.1380/ejssnt.2011.158
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Scanning photoelectron microscopy (SPEM) is a powerful technique to image and probe micro and nano structures. Recent achievements on imaging the sub-micro objects will be present in this report. For the first time, SPEM is used to explore and probe the chemical state and chemical composition of individual ZnO nanostructures. The capability of SPEM on imaging an individual MWCNT is shown which is down to 50 nm in diameter. The MWCNTs, partially covered with a metal, successfully are fabricated and presence of a sharp interface between CNT and metal is confirmed by SPEM. The morphology, composition and oxidation/reduction of isolated supported PtRh micro- and nano-particles produced by pulsed-laser deposition (PLD) have been investigated by SPEM.
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收藏
页码：158 / 162
页数：5
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