STUDY OF THE IDEAL-VACANCY-INDUCED NEUTRAL DEEP LEVELS IN III-V COMPOUND SEMICONDUCTORS AND THEIR TERNARY ALLOYS

被引:55
作者
DASSARMA, S [1 ]
MADHUKAR, A [1 ]
机构
[1] UNIV SO CALIF, DEPT PHYS, LOS ANGELES, CA 90007 USA
来源
PHYSICAL REVIEW B | 1981年 / 24卷 / 04期
关键词
D O I
10.1103/PhysRevB.24.2051
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2051 / 2068
页数:18
相关论文
共 39 条
[1]   SIMPLE PARAMETRIZED MODEL FOR JAHN-TELLER SYSTEMS - VACANCY IN P-TYPE SILICON [J].
BARAFF, GA ;
KANE, EO ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1980, 21 (08) :3563-3570
[2]   SILICON VACANCY - POSSIBLE ANDERSON NEGATIVE-U SYSTEM [J].
BARAFF, GA ;
KANE, EO ;
SCHLUTER, M .
PHYSICAL REVIEW LETTERS, 1979, 43 (13) :956-959
[3]   THEORY OF CHEMISORPTION ON METALLIC SURFACES - ROLE OF INTRA-ADSORBATE COULOMB CORRELATION AND SURFACE-STRUCTURE [J].
BELL, B ;
MADHUKAR, A .
PHYSICAL REVIEW B, 1976, 14 (10) :4281-4294
[4]   INTERPRETATION OF ELECTRONIC-SPECTRA OF CHEMISORBED SYSTEMS [J].
BELL, B ;
MADHUKAR, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01) :345-348
[5]   SELF-CONSISTENT METHOD FOR POINT-DEFECTS IN SEMICONDUCTORS - APPLICATION TO VACANCY IN SILICON [J].
BERNHOLC, J ;
LIPARI, NO ;
PANTELIDES, ST .
PHYSICAL REVIEW LETTERS, 1978, 41 (13) :895-899
[6]   SCATTERING-THEORETIC METHOD FOR DEFECTS IN SEMICONDUCTORS .2. SELF-CONSISTENT FORMULATION AND APPLICATION TO THE VACANCY IN SILICON [J].
BERNHOLC, J ;
LIPARI, NO ;
PANTELIDES, ST .
PHYSICAL REVIEW B, 1980, 21 (08) :3545-3562
[7]   SCATTERING-THEORETIC METHOD FOR DEFECTS IN SEMICONDUCTORS .1. TIGHT-BINDING DESCRIPTION OF VACANCIES IN SI, GE, AND GAAS [J].
BERNHOLC, J ;
PANTELIDES, ST .
PHYSICAL REVIEW B, 1978, 18 (04) :1780-1789
[8]   LOCALIZED DEFECTS IN SEMICONDUCTORS [J].
CALLAWAY, J ;
HUGHES, AJ .
PHYSICAL REVIEW, 1967, 156 (03) :860-+
[9]   (110) SURFACE ATOMIC STRUCTURES OF COVALENT AND IONIC SEMICONDUCTORS [J].
CHADI, DJ .
PHYSICAL REVIEW B, 1979, 19 (04) :2074-2082
[10]   NONLOCAL PSEUDOPOTENTIAL CALCULATIONS FOR ELECTRONIC-STRUCTURE OF 11 DIAMOND AND ZINCBLENDE SEMICONDUCTORS [J].
CHELIKOWSKY, JR ;
COHEN, ML .
PHYSICAL REVIEW B, 1976, 14 (02) :556-582