ELECTRON-DIFFRACTION AND MICROSCOPY STUDIES OF THE STRUCTURE OF GRAIN-BOUNDARIES IN SILICON

被引：40

作者：

CARTER, CB ^{[1
]}

FOLL, H ^{[1
]}

AST, DG ^{[1
]}

SASS, SL ^{[1
]}

机构：

[1] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1981年 / 43卷 / 02期

关键词：

D O I：

10.1080/01418618108239420

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：441 / 467

页数：27

共 21 条

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