LOW-TEMPERATURE ANNEALING OF AS-IMPLANTED GE

被引:9
作者
HATTANGADY, SV [1 ]
FOUNTAIN, GG [1 ]
NICOLLIAN, EH [1 ]
MARKUNAS, RJ [1 ]
机构
[1] UNIV N CAROLINA,DEPT ELECT ENGN,CHARLOTTE,NC 28223
关键词
D O I
10.1063/1.340464
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:68 / 74
页数:7
相关论文
共 50 条
[21]   PULSED ELECTRON BEAM ANNEALING APPARATUS AND ANNEALING OF As-IMPLANTED SILICON. [J].
Itoh, T. ;
Rao, D.X. ;
Tamura, H. ;
Ohkubo, Y. .
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1981, 2 (03) :234-239
[22]   REVERSE ANNEALING AND LOW-TEMPERATURE DIFFUSION OF BORON IN BORON-IMPLANTED SILICON [J].
HUANG, J ;
FAN, D ;
JACCODINE, RJ .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (11) :5521-5525
[23]   LOW-TEMPERATURE ANNEALING BEHAVIOR OF 2 SPECIES (ARGON AND ANTIMONY) IMPLANTED SILICON [J].
SPINELLI, P ;
BRUEL, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 209 (MAY) :751-753
[24]   RAPID ISOTHERMAL ANNEALING OF AS-IMPLANTED, P-IMPLANTED, AND B-IMPLANTED SILICON [J].
WILSON, SR ;
PAULSON, WM ;
GREGORY, RB ;
HAMDI, AH ;
MCDANIEL, FD .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (12) :4162-4170
[25]   LOW-TEMPERATURE ANNEALING CHARACTERISTICS OF LOW-ENERGY BF2+ IMPLANTED SILICON [J].
TATSUTA, S ;
SAKURAI, T .
FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1978, 14 (04) :73-82
[26]   Analysis of kink concentration during low-temperature annealing of low-energy implanted boron [J].
Furuta, Y ;
Kim, R ;
Xia, JX ;
Aoki, T ;
Saito, T ;
Kamakura, Y ;
Taniguchi, K .
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 2002, 85 (05) :29-34
[27]   Low-temperature strain relaxation in SiGe/Si heterostructures implanted with Ge+ ions [J].
Avrutin, VS ;
Izyumskaya, NF ;
Vyatkin, AF ;
Zinenko, VI ;
Agafonov, YA ;
Irzhak, DV ;
Roshchupkin, DV ;
Steinman, EA ;
Vdovin, VI ;
Yugova, TG .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2003, 100 (01) :35-39
[28]   LOW-TEMPERATURE PHOTOLUMINESCENCE OF GE=AS AND GE=GA [J].
CHEN, M ;
SMITH, DL ;
MCGILL, TC .
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03) :350-350
[29]   LOW-TEMPERATURE ANNEALING OF AL-IMPLANTED SI-SIO2 STRUCTURES [J].
ABERG, AT .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 42 (02) :639-645
[30]   Pre-Amorphization and Low-Temperature Implantation for Efficient Activation of Implanted As in Ge(100) [J].
Murakami, Hideki ;
Hamada, Shinya ;
Ono, Takahiro ;
Hashimoto, Kuniaki ;
Ohta, Akio ;
Hanafusa, Hiroaki ;
Higashi, Seiichiro ;
Miyazaki, Seiichi .
SIGE, GE, AND RELATED COMPOUNDS 6: MATERIALS, PROCESSING, AND DEVICES, 2014, 64 (06) :423-429