ELECTRON-PROBE MICROANALYSIS OF FILAMENTARY SILICON-CRYSTALS

被引：0
|
作者：
SHCHEVELEVA, GM
机构：
来源：
INORGANIC MATERIALS | 1978年 / 14卷 / 04期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：469 / 470
页数：2
相关论文
共 50 条
  • [1] ELECTRON-PROBE MICROANALYSIS
    HALL, TA
    GUPTA, BL
    MORETON, RB
    TRENDS IN BIOCHEMICAL SCIENCES, 1977, 2 (02) : N39 - N40
  • [2] ELECTRON-PROBE MICROANALYSIS
    FUJINO, T
    MIZUHIRA, V
    JAPAN ANALYST, 1974, : R42 - R46
  • [3] ELECTRON-PROBE MICROANALYSIS
    COSSLETT, VE
    CASTAING, R
    CLAYTON, DB
    MULVEY, T
    ADAMS, AMJ
    DUCKWORTH, WE
    SWINDELLS
    BIRD, RJ
    RANZETTA, GV
    THEISEN, R
    PHILIBERT, J
    BAILEY, GLJ
    HUMEROTHERY, W
    DUNCUMB, P
    KIRIANENKO, A
    JOURNAL OF THE INSTITUTE OF METALS, 1962, 91 (02): : 72 - &
  • [4] ELECTRON-PROBE MICROANALYSIS
    不详
    LANCET, 1966, 1 (7439): : 696 - +
  • [5] THERMISTORS BASED ON FILAMENTARY SILICON-CRYSTALS
    DROZHZHIN, AI
    SHCHETININ, AA
    SEDYKH, NK
    NOVOKRESHCHENOVA, EP
    DUNAEV, AI
    SARYKALIN, VN
    MEASUREMENT TECHNIQUES, 1978, 21 (11) : 1553 - 1555
  • [6] SCANNING ELECTRON-PROBE MICROANALYSIS
    HEINRICH, KFJ
    ADVANCES IN OPTICAL & ELECTRON MICROSCOPY, 1975, 6 : 275 - 301
  • [7] PROGRESS IN ELECTRON-PROBE MICROANALYSIS
    BASTIN, GF
    HEIJLIGERS, HJM
    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 1990, 21 (02) : 90 - 92
  • [8] QUANTITATIVE ELECTRON-PROBE MICROANALYSIS
    POOLE, DM
    THOMAS, PM
    JOURNAL OF THE INSTITUTE OF METALS, 1962, 90 (06): : 228 - &
  • [9] ELECTRON-PROBE MICROANALYSIS IN GEOSCIENCES
    GOOLEY, R
    SCANNING ELECTRON MICROSCOPY, 1981, : 493 - 502
  • [10] SCANNING ELECTRON-PROBE MICROANALYSIS
    DUNCUMB, P
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1993, (130): : 43 - 52
12345