PHOTO-SCANNING OF CDTE DETECTORS FOR INVESTIGATION OF CRYSTAL QUALITY AND CONTACT-BEHAVIOR

被引：2

作者：

TOVE, PA ^{[1
]}

SLAPA, M ^{[1
]}

机构：

[1] UNIV UPPSALA, INST TECHNOL, DEPT ELECTR, UPPSALA, SWEDEN

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1977年 / 12卷 / 02期

关键词：

D O I：

10.1051/rphysap:01977001202034900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：349 / 353

页数：5

相关论文

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