QUALIFICATION OF INTEGRATED-CIRCUITS

被引：0

作者：

WURNIK, F

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1986年 / 26卷 / 04期

关键词：

D O I：

10.1016/0026-2714(86)90012-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：665 / 677

页数：13

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