MEASUREMENT OF IMPEDANCE BY CROSS-COUPLER AND SLIDING SHORT AT MICROWAVE-FREQUENCIES

被引：1

|

作者：

MISRA, DK

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1978年 / 27卷 / 03期

关键词：

D O I：

10.1109/TIM.1978.4314689

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：300 / 301

页数：2

相关论文

共 50 条

[41] MEASUREMENT OF GENERATOR IMPEDANCE USING A SLIDING SHORT-CIRCUIT
ALFORD, A
MICROWAVE JOURNAL, 1986, 29 (08) : 117 - 118
[42] Measurement of the permittivity of low-impedance composite materials at microwave frequencies
Dmitrienko, G. V.
Anisimov, V. G.
MEASUREMENT TECHNIQUES, 2009, 52 (02) : 177 - 183
[43] Measurement of the permittivity of low-impedance composite materials at microwave frequencies
G. V. Dmitrienko
V. G. Anisimov
Measurement Techniques, 2009, 52 : 177 - 183
[44] FREE-SPACE MEASUREMENT OF COMPLEX PERMITTIVITY AND COMPLEX PERMEABILITY OF MAGNETIC-MATERIALS AT MICROWAVE-FREQUENCIES
GHODGAONKAR, DK
VARADAN, VV
VARADAN, VK
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (02) : 387 - 394
[45] MEASUREMENT OF TRANSITION-TEMPERATURES (SIMULTANEOUSLY AT DC AND MICROWAVE-FREQUENCIES) ON HIGH-T(C) SUPERCONDUCTING SYSTEMS
PRAGASAM, R
MURTHY, VRK
VISWANATHAN, B
SOBHANADRI, J
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1994, 142 (02): : 465 - 471
[46] MEASUREMENTS OF SURFACE IMPEDANCE, LONDON PENETRATION DEPTH, AND COHERENCE LENGTH IN Y-BA-CU-O FILMS AT MICROWAVE-FREQUENCIES
JIANG, H
YUAN, T
HOW, H
WIDOM, A
VITTORIA, C
CHRISEY, D
HORWITZ, J
DREHMAN, A
PHYSICAL REVIEW B, 1994, 49 (14): : 9924 - 9932
[47] METHOD FOR ACCURATE MEASUREMENT OF IMPEDANCE AT MICROWAVE FREQUENCIES USING DIRECTIONAL COUPLERS IN WAVE GUIDES.
Parshad, R.
Chandra, K.
Agarwal, R.K.
Indian Journal of Pure and Applied Physics, 1975, 13 (05): : 325 - 327
[48] A NEW AUTOMATED WAVE-GUIDE SYSTEM FOR THE PRECISE MEASUREMENT OF COMPLEX PERMITTIVITY OF LOW-TO-HIGH-LOSS LIQUIDS AT MICROWAVE-FREQUENCIES
KAATZE, U
POTTEL, R
WALLUSCH, A
MEASUREMENT SCIENCE AND TECHNOLOGY, 1995, 6 (08) : 1201 - 1207
[49] METHOD FOR DIRECT MEASUREMENT OF Y-PARAMETERS,Z-PARAMETERS,H-PARAMETERS AND G-PARAMETERS AT MICROWAVE-FREQUENCIES
KOTZEBUE, KL
ELECTRONICS LETTERS, 1978, 14 (15) : 455 - 456
[50] Dielectric Resonators for the Measurement of Superconductor Thin Films Surface Impedance in Magnetic Fields at High Microwave Frequencies
N. Pompeo
R. Marcon
E. Silva
Journal of Superconductivity and Novel Magnetism, 2007, 20 : 71 - 82

← 1 2 3 4 5 →