X-RAY CAMERA FOR INVESTIGATING STRAIN OF FILAMENTARY CRYSTALS

被引：0

作者：

ELISEENK.LG

LEBEDINS.SB

LINKOVA, DE

机构：

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR | 1970年 / 01期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：255 / &

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