THIN-FILM TECHNIQUE FOR EXPERIMENTAL DETERMINATION OF ELASTIC STRAIN ON ELECTRON MEAN FREE PATH AND ON FREE-ELECTRON DENSITY IN BULK METALS

被引：3
作者：
MEIKSIN, ZH
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 08期
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D O I：
10.1063/1.1656887
中图分类号：
O59 [应用物理学];
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页码：3996 / &
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共 30 条
[1]  
BASSETT GA, 1959, STRUCTURE PROPERTIES, P11
[2]  
Braunsfurth G, 1931, ANN PHYS-BERLIN, V9, P385
[3]   The effect of tension on the transverse and longitudinal resistance of metals. [J].
Bridgman, PW .
PROCEEDINGS OF THE AMERICAN ACADEMY OF ARTS AND SCIENCES, 1925, 60 (1/14) :423-449
[4]  
CHOPRA KL, 1964, SINGLE CRYSTAL FILMS, P373
[5]  
COTTEY AA, 1968, J THIN SOLID FILMS, V1
[6]   THE ELECTRICAL CONDUCTIVITY OF THIN WIRES [J].
DINGLE, RB .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1950, 201 (1067) :545-560
[7]   HIGHLY-CONDUCTING GOLD FILMS PREPARED BY VACUUM EVAPORATION [J].
ENNOS, AE .
BRITISH JOURNAL OF APPLIED PHYSICS, 1957, 8 (03) :113-117
[8]  
FRANCOMBE MH, 1964, SINGLE CRYSTAL FI ED, P373
[9]   The conductivity of thin metallic films according to the electron theory of metals [J].
Fuchs, K .
PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108
[10]  
Hamburger L, 1931, ANN PHYS-BERLIN, V10, P789
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