X-RAY PHOTOELECTRON DIFFRACTION WITH HIGH ANGULAR RESOLUTION

被引：2
|
作者：
OSTERWALDER, J
STEWART, E
SAIKI, R
CYR, D
FADLEY, CS
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.574371
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：661 / 663
页数：3
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