CONCURRENT ERROR-DETECTION IN HIGHLY STRUCTURED LOGIC-ARRAYS

被引：15
作者：
FUCHS, WK
CHEN, CYR
ABRAHAM, JA
机构：
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1987年 / 22卷 / 04期
关键词：
D O I：
10.1109/JSSC.1987.1052776
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：583 / 594
页数：12
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