CONCURRENT ERROR-DETECTION IN HIGHLY STRUCTURED LOGIC-ARRAYS

被引：15

|

作者：

FUCHS, WK

CHEN, CYR

ABRAHAM, JA

机构：

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1987年 / 22卷 / 04期

关键词：

D O I：

10.1109/JSSC.1987.1052776

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：583 / 594

页数：12

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