AN X-RAY DIFFRACTION METHOD FOR THE STUDY OF SUBSTRUCTURE OF CRYSTALS

被引：20

作者：

INTRATER, J

WEISSMANN, S

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1954年 / 7卷 / 11期

关键词：

D O I：

10.1107/S0365110X54002216

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：729 / &

共 10 条

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[7] A NEW X-RAY DIFFRACTION METHOD FOR STUDYING IMPERFECTIONS OF CRYSTAL STRUCTURE IN POLYCRYSTALLINE SPECIMENS [J].

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JOURNAL OF APPLIED PHYSICS, 1951, 22 (05) :665-672

[8] STUDY OF IMPERFECTIONS OF CRYSTAL STRUCTURE IN POLYCRYSTALLINE MATERIALS - LOW CARBON ALLOY AND SILICON FERRITE [J].

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[9]

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[10] AN X-RAY STUDY OF THE SUBSTRUCTURE OF FINE-GRAINED ALUMINUM [J].

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