A CONSISTENT DEFINITION OF PROBE SIZE AND SPATIAL-RESOLUTION IN THE ANALYTICAL ELECTRON-MICROSCOPE

被引：59

作者：

MICHAEL, JR ^{[1
]}

WILLIAMS, DB ^{[1
]}

机构：

[1] LEHIGH UNIV,DEPT MAT SCI & ENGN,WHITAKER LAB 5,BETHLEHEM,PA 18015

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1987年 / 147卷

关键词：

D O I：

10.1111/j.1365-2818.1987.tb02840.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：289 / 303

页数：15

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