A built-in current sensor for testing analog circuit blocks

被引:0
作者
Tabatabaei, S [1 ]
Ivanov, A [1 ]
机构
[1] Univ British Columbia, Dept Elect & Comp Engn, Vancouver, BC V6T 1Z4, Canada
来源
IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3 | 1999年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A built-in current (BIC) sensor circuit is proposed for supply current (I-DD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the I-DD path. The circuit has been implemented using a standard 0.5 mu CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included.
引用
收藏
页码:1403 / 1408
页数:6
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