A built-in current sensor for testing analog circuit blocks

被引：0

作者：

Tabatabaei, S ^{[1
]}

Ivanov, A ^{[1
]}

机构：

[1] Univ British Columbia, Dept Elect & Comp Engn, Vancouver, BC V6T 1Z4, Canada

来源：

IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3 | 1999年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A built-in current (BIC) sensor circuit is proposed for supply current (I-DD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the I-DD path. The circuit has been implemented using a standard 0.5 mu CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included.

引用

页码：1403 / 1408

页数：6

共 20 条

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